Scanning Force Microscope/Microscopy (SFM)

by Dr. Daisuke Fujita

Scanning force microscope/microscopy (SFM) is an instrument/method able to analyze a sample by scanning a force sensor tip over the surfaces, where the force between tip and sample is monitored and used to control of the tip-sample separation. SFM is capable of determining the topography of both insulating and conducting surfaces.

NOTE 1 Scanning force microscopy was invented by G. Binnig, C. F. Quate and Ch. Gerber in 1986.

NOTE 2 SFM is often used as the same meaning as atomic force microscopy (AFM).

Reference
[1] G. Binnig, C. F. Quates and Ch. Gerber, "Atomic force microscopy", Phys. Rev. Lett. 56, 930-933 (1986)